The U. S. department of energy (doe) light-emitting diode driver reliability test performance

According to foreign media reports, the U. S. department of energy ( DOE） Recently released third LED driver reliability based on long term accelerated life test report. The U. S. department of energy (doe) solid-state lighting ( SSL) The researchers believe that the latest results have confirmed that the accelerated stress test ( AST） Party

according to foreign media reports, the U. S. department of energy (doe) recently released based on long-term accelerated life test of third light-emitting diode driver reliability report. The U. S. department of energy (doe) solid-state lighting ( SSL) The researchers believe that the latest results confirmed that the accelerated stress test ( AST) Method, which performed well in a variety of harsh conditions. In addition, the test results and fault factors can inform driver developer to further improve the reliability of the related strategy. As is known to all, light emitting diode drive, like leds components themselves, for the best lighting quality is very important. The appropriate driver design can eliminate flicker and provide uniform illumination. Drive is most likely to appear in led lamp or lamps fault components. After realize the importance of the driver, the doe in 2017 launched a long-term driver test project. The project involves the single channel and multi-channel drives, can be used in devices such as fixed ceiling groove. The U. S. department of energy (doe) has already issued two reports about the testing process and progress. Now it is the third test data report, including the products under the condition of the AST 6000 - operation The test results of 7500 hours. In fact, over the years, the industry doesn't have much time in the normal operating environment test drive. Instead, the U. S. department of energy and its contractors RTI International, have in what they call 7575 environment test driver - — Keep indoor humidity and temperature at 75 degrees; c。 The test includes two independent of the channel drive test phase. Single stage design cost is relatively low, but it lacks a single circuit, first to convert ac to DC, then adjust current, it is unique to the two stage design. The U. S. department of energy (doe), according to a report in 11 different drive test, all drives in 7575 with a run of 1000 hours. When the driver is located in the indoor environment, light emitting diode load connected to the driver in outdoor environment, therefore the AST environment affects only the driver. Under the condition of the doe not AST operation time and operation under the normal environment of time together. The first batch of equipment malfunction after running 1250 hours, although some equipment is still running. After 4800 hours of testing, 64% of equipment malfunction. However, considering the bad test environment, these results have been very good. The researchers found that most of the faults in the first phase of the drive, especially in power factor correction and electromagnetic interference suppression circuit. In the two stages of drives, field effect transistor has fault. In addition to the specified drive design can improve the power factor correction and metal oxide semiconductor field effect transistor, AST also shows that failure can often predict according to the monitored the performance of the drive. For example, to monitor the power factor and surge current can detect early fault in advance. The flashing increase suggests imminent failure. For a long time, the department of energy's SSL plan has been carried out in the field of SSL important test and research, including the gateway project application scenario for the product under test and caliper commercial product performance test under the project. rod