Hidden crack is one of the types of crystalline silicon pv modules are common defects, some popular speaking, is not visible to the naked eye fine cracks, micro- crack) 。 Crystalline silicon components due to the nature of its crystal structure, very easy to fracture. In the crystalline silicon components
crack is a common defect of crystalline silicon pv modules. In general, it is micro cracks of some invisible to the naked eye. Crystalline silicon components because of its crystal structure is very easy to break. In the process of production of crystalline silicon components, many links could lead to cell rupture. The root cause of the crack can be summarized as mechanical stress and thermal stress on the silicon wafer. At present, in order to reduce costs, crystalline silicon cells, are moving in the direction of more and more thin, this reduces cell to prevent the mechanical damage, and it is easier to crack. Cell current is mainly composed of surface perpendicular lines to the main grid and fine grid collection and derivation. Thus, when the crack ( Most of the parallel to the main grid line) Lead to fine grid line fault, the current cannot be effectively passed to the main grid line, lead to failure, part of the cell or even the whole and debris, hot spots, etc. , at the same time lead to the power attenuation components. Crack perpendicular to the main gate line will have little impact on the thin gate line, therefore the failure of cell area is almost zero. Rapid development of thin film solar cells, however, because of its material and structural features and there is no failure problem. At the same time, the cell surface through a layer of transparent conductive film to collect and transmit current, even if the conductive due to the small defects in cell membrane rupture, also will not lead to a widespread failure of battery. Some studies have shown that if a battery module failure area is less than 8%, little impact on power module, module of two-thirds of the inclined stripe has no effect on the module of power. Therefore, although the cracking is a common problem in crystalline silicon cells, but there is no need to worry too much. Electroluminescent is a kind of solar cell or component internal defect detection equipment, the crack detection method is a simple and effective. Use electroluminescent principle of crystalline silicon, using high resolution infrared camera device near infrared image, and to determine the device for defects. It has high sensitivity, fast detection and direct result directly. The causes of the formation of 'cracks' external forces: cell in welding, laminating, framework or in the process of handling, installation and construction, will be affected by external forces. When the parameter set at the time, no equipment failure or improper operation will lead to cracking. High temperature: no cell in low temperature preheating, in a short period of time will suddenly exposed to high temperatures, can cause cracking phenomena, such as soldering temperature is too high, laminating temperature setting is not reasonable, etc. Raw material: the defects of raw materials is also one of the main factors that lead to cracking. In the production process and subsequent storage, transportation and installation process, prevent cell inappropriate intervention force, but also pay attention to the storage environment temperature range. During the welding process, the cell should advance insulation ( Manual welding) Solder iron temperature should conform to the requirements.