GBT 33720- 2017 publication of accelerated test method for luminous flux attenuation of LED lighting products

May 12, 2017 National Standard Committee issued the national standard of the People's Republic of China announcement 2017 11th, of by semiconductor lighting combined with innovation state key room took the lead in the preparation of the national standard GB/T 33720- 2017 'accelerated test method for luminous flux attenuation of LED lighting products' was released and will be implemented in December 1, 2017. May 12, 2017 National Standard Committee issued the national standard of the People's Republic of China announcement 2017 11th, of by semiconductor lighting combined with innovation state key room took the lead in the preparation of the national standard GB/T 33720- 2017 'accelerated test method for luminous flux attenuation of LED lighting products' was released and will be implemented in December 1, 2017. GB/T 33720- 2017 'accelerated test method of LED lighting product's luminous flux attenuation' is the transformation of the results of the general research project of semiconductor lighting product's reliability accelerated test and analysis in the State Key Laboratory of semiconductor lighting joint innovation, A set of feasible and reasonable detection methods is provided for quickly and effectively judging the luminous flux attenuation characteristics of LED lighting products, on the premise of not affecting the accuracy of reliability evaluation, the traditional test time of 6000h is shortened to less than 2000 h, and the color stability of LED lighting products, and other subsystems such as power drive, heat dissipation structure and secondary optical design have established basic reliability requirements, which can be widely applied to most indoor LED lighting lamps, road lighting lamps and special lighting lamps in the market. This standard saves a lot of testing time for LED lighting enterprises in China, and is of great significance for reducing the research and development cycle and cost of enterprises and accelerating the development of LED lighting industry. Drafting Unit of this standard: State Key Laboratory of semiconductor lighting joint innovation (Beijing Semiconductor Lighting Technology Promotion Center) , Changzhou Wujin district Semiconductor Lighting Application Technology Research Institute, Hebei Lide Electronics Co. , Ltd. , Shanghai time light lighting electrical testing Co. , Ltd. , Institute of Semiconductors, Chinese Academy of Sciences, Hangzhou Yuanfang photoelectric information Co. , Ltd. , National Semiconductor devices quality Supervision and Inspection Center, Guangzhou Saixi standard testing Research Institute Co. , Ltd. , Xiamen Hualian Electronics Co. , Ltd. , Foshan Guoxing Optoelectronics Co. , Ltd. , Guangdong Dehao Runda Electric Co. , Ltd. , Huizhou Rex Optoelectronics Technology Co. , Ltd. , Nanjing henderson Technology Co. , Ltd. , Ningbo Liaoyuan Lighting Co. , Ltd. , Ningbo Shengpu optoelectronic semiconductor Co. , Ltd. , Sanan Optoelectronics Co. , Ltd. , Shanxi Guangyu Semiconductor Lighting Co. , Ltd. , Shanghai Yaming Lighting Co. , Ltd. , Sichuan Jiuzhou optoelectronics Technology Co. , Ltd. , Wuxi huazhaohong Optoelectronics Technology Co. , Ltd. , Shenzhen Lehman Optoelectronics Technology Co. , Ltd. , Shenzhen zhouming Technology Co. , Ltd. , Shenzhen Wanrun Technology Co. , Ltd. , Shenzhen juzuo Lighting Co. , Ltd. limited company. The main drafters of this standard: yuan Changan, Qian Cheng, fan Xuejun, Zhang Guoqi, Xu Shaowei, Li Bo, Zhou Xiang, Zhu Xiaodong, Huang Jie, Yu Anqi, Gao Wei, fan Jiajie, Li Jinyu, Wang Junxi, Zhao Lixia, Pan jian Gen, Zhao Lubing, Zhou Gang, Chen Jie, Li Cheng, Xie Wei, Xiong Fei, Han Licheng, Sun Jianjiang, Niu Hongqiang, Cai Weizhi, Xu Min, Zhu Huarong, Zhong Xiong, Chang Baoyan, Tu Menglong li Jianghai, Li Zhijiang, Huang Heming.